Electrical applications

The Probe Thermal Stage is specifically designed for testing the electrical properties of samples under varying temperatures, used to characterize the variation patterns of material electrical properties with temperature. Based on the optical thermal stage, this device integrates an electrical module (including probes, displacement mechanisms, and electrical interfaces). By moving the probes, precise contact between the probe tips and any area on the sample surface can be achieved. Electrical signals are transmitted to external measuring instruments (such as source meters, digital multimeters, etc.) through probes, signal lines, and interfaces to obtain relevant electrical data, thereby analyzing the electrical properties of materials at different temperatures.

 

Probe Thermal Stages can be divided into internally adjusted probe stations, externally adjusted probe stations, and electrically controlled probe stations, etc., based on the different types of probe holders. This series of products features precise temperature control capabilities over an ultra-wide range from 4K to 1700°C. 

According to the target temperature and application characteristics, it integrates various cutting-edge temperature control solutions including liquid helium refrigeration, liquid nitrogen refrigeration, thermoelectric refrigeration, resistance heating, infrared heating, laser heating, etc., providing strong support for complex temperature-varying experiments.

At the same time, multi-language SDKs (such as Labview, C#, etc.) are provided to enable customers to achieve efficient customized integration.